STEREO MOIRE TECHNIQUE: A NOVEL 3-D MEASUREMENT METHOD USING A STEREO CAMERA AND A DIGITAL PATTERN PROJECTOR

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dc.contributor.authorLee, Hyunkiko
dc.contributor.authorCho, Hyungsuckko
dc.date.accessioned2013-03-06T21:03:03Z-
dc.date.available2013-03-06T21:03:03Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-
dc.identifier.citationINTERNATIONAL JOURNAL OF OPTOMECHATRONICS, v.1, no.2, pp.209 - 230-
dc.identifier.issn1559-9612-
dc.identifier.urihttp://hdl.handle.net/10203/88450-
dc.description.abstractThis article deals with a novel 3-D sensor system that employs a measurement technique called the Stereo Moire technique. The general Moire method, which is well known for fast and accurate 3-D measurement, has suffered from an inherent limitation in that it cannot measure the absolute 3-D depth due to 2 pi ambiguity caused by regularity of fringe. In this article, to overcome this 2 pi ambiguity and obtain the exact depth value effectively, a novel method is proposed. The measurement system consists of a digital pattern projector and two cameras, which can indirectly detect two phase information on the fringe patterns projected onto an object's surface. These two phase values are different due to the difference in camera position. However, the depth values obtained at two different phase information must be identical because the two cameras look at the same point on the object being measured. To verify the efficiency and accuracy of the proposed method, a series of experimental tests was performed. Through the experiments, it is shown that the proposed method can effectively overcome the 2 pi ambiguity of the typical Moire technique, and obtain the absolute depth value of the 3-D scene geometric information with satisfactory accuracy.-
dc.languageEnglish-
dc.publisherTAYLOR & FRANCIS INC-
dc.titleSTEREO MOIRE TECHNIQUE: A NOVEL 3-D MEASUREMENT METHOD USING A STEREO CAMERA AND A DIGITAL PATTERN PROJECTOR-
dc.typeArticle-
dc.identifier.wosid000207178500006-
dc.type.rimsART-
dc.citation.volume1-
dc.citation.issue2-
dc.citation.beginningpage209-
dc.citation.endingpage230-
dc.citation.publicationnameINTERNATIONAL JOURNAL OF OPTOMECHATRONICS-
dc.identifier.doi10.1080/15599610701397482-
dc.contributor.localauthorCho, Hyungsuck-
dc.contributor.nonIdAuthorLee, Hyunki-
dc.type.journalArticleArticle-
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