Chemisorption of acetic acid on Si(100)-2x1 at room temperature

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dc.contributor.authorLee H.-K.ko
dc.contributor.authorKim K.-J.ko
dc.contributor.authorHan J.-H.ko
dc.contributor.authorKang T.-H.ko
dc.contributor.authorChung J.W.ko
dc.contributor.authorKim B.ko
dc.date.accessioned2013-03-06T09:36:39Z-
dc.date.available2013-03-06T09:36:39Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-
dc.identifier.citationPHYSICAL REVIEW B, v.77, no.11-
dc.identifier.issn1098-0121-
dc.identifier.urihttp://hdl.handle.net/10203/86580-
dc.description.abstractWe have investigated adsorption of acetic acid on Si (100)-2x1 at room temperature using high-resolution photoemission spectroscopy and near edge x-ray adsorption fine structure (NEXAFS) measurements in the partial electron yield mode. At room temperature, an acetic-acid molecule is found to chemisorb on Si (100)-2x1 surface through the formation of the O-H dissociation structure. NEXAFS was conducted to characterize the adsorption geometry of acetic acid on Si (100). The pi* orbital of the C = O bond shows a good angle dependence in carbon K-edge NEXAFS spectra, and we estimate the adsorption angle between chemisorbed acetic acid of C = O bond and the Si (100) surface normal as similar to 41 degrees +/- 2 degrees using an analytical solution of NEXAFS intensity.-
dc.languageEnglish-
dc.publisherAMER PHYSICAL SOC-
dc.subjectHIGH-RESOLUTION PHOTOEMISSION-
dc.subjectPHOTOELECTRON-SPECTROSCOPY-
dc.subjectADSORPTION-
dc.subjectX-1-
dc.subjectSURFACE-
dc.subjectELECTRONICS-
dc.subjectSELECTIVITY-
dc.subjectMOLECULES-
dc.subjectCHEMISTRY-
dc.subjectBEAMLINE-
dc.titleChemisorption of acetic acid on Si(100)-2x1 at room temperature-
dc.typeArticle-
dc.identifier.wosid000254542800120-
dc.identifier.scopusid2-s2.0-41449088399-
dc.type.rimsART-
dc.citation.volume77-
dc.citation.issue11-
dc.citation.publicationnamePHYSICAL REVIEW B-
dc.identifier.doi10.1103/PhysRevB.77.115324-
dc.contributor.localauthorKim K.-J.-
dc.contributor.nonIdAuthorLee H.-K.-
dc.contributor.nonIdAuthorHan J.-H.-
dc.contributor.nonIdAuthorKang T.-H.-
dc.contributor.nonIdAuthorChung J.W.-
dc.contributor.nonIdAuthorKim B.-
dc.type.journalArticleArticle-
dc.subject.keywordPlusHIGH-RESOLUTION PHOTOEMISSION-
dc.subject.keywordPlusPHOTOELECTRON-SPECTROSCOPY-
dc.subject.keywordPlusADSORPTION-
dc.subject.keywordPlusX-1-
dc.subject.keywordPlusSURFACE-
dc.subject.keywordPlusELECTRONICS-
dc.subject.keywordPlusSELECTIVITY-
dc.subject.keywordPlusMOLECULES-
dc.subject.keywordPlusCHEMISTRY-
dc.subject.keywordPlusBEAMLINE-
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