The effects of a magnetic field dependent critical current on the hysteresis loss of a coated conductor

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dc.contributor.authorYoo, Jaeunko
dc.contributor.authorLee, SangMooko
dc.contributor.authorJung, YeHyunko
dc.contributor.authorLee, Jaeyoungko
dc.contributor.authorXuan, DNko
dc.contributor.authorYoum, Do-Junko
dc.contributor.authorKim, Hosupko
dc.contributor.authorHa, Hongsooko
dc.contributor.authorSong, KyuJeongko
dc.contributor.authorOh, SangSooko
dc.contributor.authorOh, Sangjunko
dc.date.accessioned2013-03-06T08:28:22Z-
dc.date.available2013-03-06T08:28:22Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2008-08-
dc.identifier.citationSUPERCONDUCTOR SCIENCE & TECHNOLOGY, v.21-
dc.identifier.issn0953-2048-
dc.identifier.urihttp://hdl.handle.net/10203/86446-
dc.description.abstractWe calculated the current distribution in a coated conductor (CC) from magnetic induction profiles measured using the scanning Hall probe method. An external magnetic field was applied in the normal direction with respect to the tape surface and was decreased stepwise from H(peak) to -H(peak). From the hysteretic behavior of the current distributions, the energy loss, Q(M), was calculated for various values of H(peak). Comparison of the present results with Brandt's theoretical calculations revealed that his formula is still valid if one substitutes the magnetic field dependent critical current density into his equation. The theoretical results obtained were consistent with the experimental Q(M) values obtained.-
dc.languageEnglish-
dc.publisherIOP PUBLISHING LTD-
dc.subjectHALL PROBE MEASUREMENTS-
dc.subjectAC LOSS CHARACTERISTICS-
dc.subjectSUPERCONDUCTOR STRIP-
dc.subjectFLUX-PENETRATION-
dc.subjectTHIN-FILMS-
dc.subjectCOEVAPORATION-
dc.subjectSUBSTRATE-
dc.subjectLAYER-
dc.titleThe effects of a magnetic field dependent critical current on the hysteresis loss of a coated conductor-
dc.typeArticle-
dc.identifier.wosid000256841500024-
dc.identifier.scopusid2-s2.0-47749132324-
dc.type.rimsART-
dc.citation.volume21-
dc.citation.publicationnameSUPERCONDUCTOR SCIENCE & TECHNOLOGY-
dc.identifier.doi10.1088/0953-2048/21/8/085020-
dc.contributor.localauthorYoum, Do-Jun-
dc.contributor.nonIdAuthorLee, Jaeyoung-
dc.contributor.nonIdAuthorKim, Hosup-
dc.contributor.nonIdAuthorHa, Hongsoo-
dc.contributor.nonIdAuthorSong, KyuJeong-
dc.contributor.nonIdAuthorOh, SangSoo-
dc.contributor.nonIdAuthorOh, Sangjun-
dc.type.journalArticleArticle-
dc.subject.keywordPlusHALL PROBE MEASUREMENTS-
dc.subject.keywordPlusAC LOSS CHARACTERISTICS-
dc.subject.keywordPlusSUPERCONDUCTOR STRIP-
dc.subject.keywordPlusFLUX-PENETRATION-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordPlusCOEVAPORATION-
dc.subject.keywordPlusSUBSTRATE-
dc.subject.keywordPlusLAYER-
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