Gd-substituted bismuth titanate film capacitors having ferroelectric reliability and large non-volatile charges

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dc.contributor.authorChon, Uko
dc.contributor.authorJang, HMko
dc.contributor.authorShin, NSko
dc.contributor.authorKim, JSko
dc.contributor.authorAhn, DCko
dc.contributor.authorKim, YSko
dc.contributor.authorNo, Kwangsooko
dc.date.accessioned2008-11-19T05:41:55Z-
dc.date.available2008-11-19T05:41:55Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2007-01-
dc.identifier.citationPHYSICA B-CONDENSED MATTER, v.388, pp.190 - 194-
dc.identifier.issn0921-4526-
dc.identifier.urihttp://hdl.handle.net/10203/7876-
dc.description.abstractFatigue-free Gd-modified bismuth titanate (Bi3.15Gd0.85Ti3O12; BGdT) film capacitors having stable charge-retaining characteristics were grown on Pt/TiO2/SiO2/Si(100) substrates using the method of metal-organic sol decomposition. The BGdT film capacitor with a top Pt electrode showed significantly improved values of the remanent polarization (2P(r)) and the non-volatile charge as compared to those of the Bi4-xLaxTi3O12 (BLT; x = 0.75) film capacitor, currently renowned as a promising candidate for non-volatile memories. The saturated 2P(r) value of the BGdT capacitor was 75 mu C/cm(2) while it remained essentially constant up to 4.5 x 10(10) read/write switching cycles at a frequency of 1 MHz. In addition to these, the capacitor demonstrated excellent charge-retention characteristics with its sensing margin of 52 mu C/cm(2) and a strong resistance against the imprinting failure. (c) 2006 Elsevier B.V. All rights reserved.-
dc.description.sponsorshipMinistry of Education, Korea through the BK 21 Program.en
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherELSEVIER SCIENCE BV-
dc.subjectBI3.25LA0.75TI3O12 THIN-FILMS-
dc.subjectFATIGUE-FREE BEHAVIOR-
dc.subjectPT/TI/SIO2/SI-
dc.subjectDECOMPOSITION-
dc.subjectRETENTION-
dc.titleGd-substituted bismuth titanate film capacitors having ferroelectric reliability and large non-volatile charges-
dc.typeArticle-
dc.identifier.wosid000243887400030-
dc.identifier.scopusid2-s2.0-33751219579-
dc.type.rimsART-
dc.citation.volume388-
dc.citation.beginningpage190-
dc.citation.endingpage194-
dc.citation.publicationnamePHYSICA B-CONDENSED MATTER-
dc.identifier.doi10.1016/j.physb.2006.05.434-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorNo, Kwangsoo-
dc.contributor.nonIdAuthorChon, U-
dc.contributor.nonIdAuthorJang, HM-
dc.contributor.nonIdAuthorShin, NS-
dc.contributor.nonIdAuthorKim, JS-
dc.contributor.nonIdAuthorAhn, DC-
dc.contributor.nonIdAuthorKim, YS-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorgadolinium-modified bismuth titanate-
dc.subject.keywordAuthorferroelectric-
dc.subject.keywordAuthorfatigue-free-
dc.subject.keywordAuthorFRAM-
dc.subject.keywordPlusBI3.25LA0.75TI3O12 THIN-FILMS-
dc.subject.keywordPlusFATIGUE-FREE BEHAVIOR-
dc.subject.keywordPlusPT/TI/SIO2/SI-
dc.subject.keywordPlusDECOMPOSITION-
dc.subject.keywordPlusRETENTION-
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