$CoSi_2/Si(111)$의 계면구조에 대한 고분해능 투과전자현미경 연구A high-resolution TEM study on the structure of $CoSi_2/Si(111)$ interface
- Advisors
- 이정용researcher; Lee, Jeong-Yongresearcher
- Description
- 한국과학기술원 : 전자재료공학과,
- Publisher
- 한국과학기술원
- Issue Date
- 1995
- Identifier
- 99495/325007 / 000933383
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 전자재료공학과, 1995.2, [ iii, 64 p. ]
- Keywords
고분해능 투과 전자 현미경
- Appears in Collection
- MS-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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