광포획된 마이크로 입자를 이용한 표면형상 측정Surface profile measurement with optically trapped micro-particles
- Advisors
- 김승우researcher; Kim, Seung-Wooresearcher
- Description
- 한국과학기술원 : 기계공학전공,
- Publisher
- 한국과학기술원
- Issue Date
- 2001
- Identifier
- 165946/325007 / 000993542
- Language
- kor
- Description
학위논문(석사) - 한국과학기술원 : 기계공학전공, 2001.2, [ iv, 59 p. ]
- Keywords
마이크로 입자; 광포획; 표면형상측정; surface profile measurement; micro-particles; optical trapping
- Appears in Collection
- ME-Theses_Master(석사논문)
- Files in This Item
- There are no files associated with this item.
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