LEE, YONGJIN; Jang, Woojin; BAE, HONGHYUN; CHO, JEONGHYUN; Kim, Hyun-Sik, 2024 IEEE International Solid-State Circuits Conference (ISSCC), pp.272 - 273, 2024-02-18
PARK, YOUSUNG; Gang, Gyeong-Gu; LIM, GYUWAN; Shin, seunghwa; Ahn, Yong-Sung; Kim, Wonyoun; Kim, Hyun-Sik, 2024 IEEE International Solid-State Circuits Conference (ISSCC), pp.432 - 433, 2024-02-18
Lee, Jun-Gi; BAE, HONGHYUN; Jang, Seunghyun; Kim, Hyun-Sik, 2024 IEEE International Solid-State Circuits Conference (ISSCC), pp.456 - 457, 2024-02-18
HAN, HYUNKI; CHO, JEONGHYUN; Jang, Woojin; PARK, YOUSUNG; LEE, JIHO; Kim, Hyun-Sik, 2024 IEEE International Solid-State Circuits Conference (ISSCC), pp.464 - 465, 2024-02-18
Kim, Daehyeon; Kim, Hyun-Sik, 2024 IEEE International Solid-State Circuits Conference (ISSCC), pp.146 - 147, 2024-02-18
Lee, Donghwan, 62nd IEEE Conference on Decision and Control, 2023-12-24
이현우; Nahrendra, I Made Aswin; 이승현; 이동규; 노승규; 명현, 제어로봇시스템학회 대전충청지부 학술대회 (ICROS 2023), 2023-12-21
이승현; 최덕규; 박재헌; 명현, 제어로봇시스템학회 대전충청지부 학술대회 (ICROS 2023), 2023-12-21
Cho, Yucheol; Choi, Geunseok; Ham, Gyeongdo; Shin, Mincheol; Kim, Dae-Shik, NeurIPS workshop on Machine Learning and the Physical Sciences, 2023, 2023-12-15
Kim, Jeonghye; Kim, Woojun; Lee, Suyoung; Sung, Youngchul, Foundation Models and Decision Making (FMDM) Workshop, NeurIPS 2023, 2023-12-15
Fix the Noise: Disentangling Source Feature for Controllable Domain Translation Lee, Dongyeun; Lee, Jae Young; Kim, Doyeon; Choi, Jaehyun; Yoo, Jaejun; Kim, Junmo, 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2023-06 |
A 2.5mW 12MHz-BW 69dB SNDR Passive Bandpass ΔΣ ADC with Highpass Noise-Shaping SAR Quantizers Oh, Sein; Park, Seunga; Jung, Yoontae; Koo, Jimin; Cho, Donghee; Ha, Sohmyung; Je, Minkyu, 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), IEEE, 2023-06-11 |
A 187dB FoMS 46fJ/Conv. 2nd-order Highpass ΔΣ Capacitance-to-Digital Converter Jung, Yoontae; Oh, Sein; Koo, Jimin; Park, Seunga; Suh, Ji-Hoon; Cho, Donghee; Ha, Sohmyung; et al, 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), IEEE, 2023-06-11 |
AccelIR: Task-aware Image Compression for Accelerating Neural Restoration Ye, Juncheol; Yeo, Hyunho; Park, Jinwoo; Han, Dongsu, 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), IEEE, 2023-06-22 |
ASIL-D Compliant Battery Monitoring IC with High Measurement Accuracy and Robust Communication Lee, Jong-Kyoung; Woo, Sunsik; Jeong, Wooyoung; Oh, Kwang-Seok; Kim, Donghyeon; Ko, Youngwoon; Jeon, Jin-Yong; et al, 2023 IEEE International Solid- State Circuits Conference (ISSCC), IEEE, 2023-02-19 |
Fast-settling Onboard Electrochemical Impedance Spectroscopy System Adopting Quasi-linear-phase Band-pass Filter Lee, Young-Nam; Choi, Kyungsik; Jo, Seong-Won; Rahim, Gul; Kwon, Kyeongha; Lee, Sang-Gug, 2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), IEEE, 2023-05-22 |
Lightweight Monocular Depth Estimation via Token-Sharing Transformer Lee, Dong-Jae; Lee, Jae Young; Shon, Hyunguk; Yi, Eojindl; Park, Yeong-Hun; Cho, Sung-Sik; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4895 - 4901, Institute of Electrical and Electronics Engineers Inc., 2023-05-28 |
Test-Time Synthetic-to-Real Adaptive Depth Estimation Yi, Eojindl; Kim, Junmo, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.4938 - 4944, Institute of Electrical and Electronics Engineers Inc., 2023-05-28 |
Adaptive Keyframe Generation based LiDAR Inertial Odometry for Complex Underground Environments Kim, Boseong; Jung, Chanyoung; Shim, David Hyunchul; Agha-Mohammadi, Ali-Akbar, 2023 IEEE International Conference on Robotics and Automation, ICRA 2023, pp.3332 - 3338, Institute of Electrical and Electronics Engineers Inc., 2023-05-30 |
Feature-Guided Machine-Centric Image Coding for Downstream Tasks Kwak, Sangwoon; Kim, Munchurl; Choo, Hyon-Gon; Yun, Joungil, 2023 IEEE International Conference on Multimedia and Expo Workshops (ICMEW), pp.176 - 181, Institute of Electrical and Electronics Engineers, 2023-07-11 |
Deep Cross-Modal Steganography Using Neural Representations Han, Gyojin; Lee, Dong-Jae; Hur, Jiwan; Choi, Jaehyun; Kim, Junmo, 2023 IEEE International Conference on Image Processing (ICIP), IEEE, 2023-10-08 |
Training Cartoonization Network without Cartoon Kim, Doyeon; Lee, Dongyeun; Joo, Donggyu; Kim, Junmo, 2023 IEEE International Conference on Image Processing (ICIP), IEEE, 2023-10-08 |
Data Poisoning Attack Aiming the Vulnerability of Continual Learning Han, Gyojin; Choi, Jaehyun; Hong, Hyeong Gwon; Kim, Junmo, 2023 IEEE International Conference on Image Processing (ICIP), IEEE, 2023-10-08 |
Grating - Resonance InGaAs Narrowband Photodetector for Multispectral Detection in NIR - SWIR Region Jang, Junho; Shim, Joonsup; Lim, Jinha; Park, Gyeong Cheol; Kim, Jongmin; Geum, Dae-Myeong; Kim, Sanghyeon, 2022 International Electron Devices Meeting, IEDM 2022, pp.1941 - 1944, Institute of Electrical and Electronics Engineers Inc., 2022-12-06 |
A 56fJ/Conversion-Step 178dB-FoMS Third-Order Hybrid CT-DT Δ∑ Capacitance-to-Digital Converter Jung, Yoontae; Koo, Jimin; Oh, Sein; Park, Seunga; Suh, Ji-Hoon; Cho, Donghee; Je, Minkyu, 2023 IEEE Custom Integrated Circuits Conference (CICC), IEEE, 2023-04 |
A 0.9V 2MHz 6.4x-Slope-Boosted Quadrature-Phase Relaxation Oscillator with 164.2dBc/Hz FoM and 62.5ppm Period Jitter in 0.18μm CMOS Seong, Hoyong; Youn, Donghyun; Choi, Injun; Lee, Junghyup; Ha, Sohmyung; Je, Minkyu, 2023 IEEE Custom Integrated Circuits Conference (CICC), IEEE, 2023-04 |
A 333TOPS/W Logic-Compatible Multi-Level Embedded Flash Compute-In-Memory Macro with Dual-Slope Computation Choi, Edward Jongyoon; Choi, Injun; Lukito, Vincent; Choi, Dong-Hwi; Yi, Donghyeon; Chang, Ik-Joon; Ha, Sohmyung; et al, 2023 IEEE Custom Integrated Circuits Conference (CICC), IEEE, 2023-04 |
Spatio-Temporal Quantitative Ultrasound Imaging for Breast Cancer Identification Oh, Seok-Hwan; Kim, Myeong-Gee; Kim, Young-Min; Jung, Guil; Kwon, Hyuksool; Bae, Hyeon-Min, 2023 IEEE 20th International Symposium on Biomedical Imaging (ISBI), IEEE, 2023-04-18 |
Chance-Constrained Control with Imperfect Perception Modules Kim, Beomjun; Ahn, Heejin, 2023 American Control Conference (ACC), pp.2568 - 2574, IEEE, 2023-06-01 |
Quantum Advantages Bae, Joonwoo, 2023 Canada-Korea Conference on Science and Technology, The Association of Korean-Canadian Scientists and Engineers (AKCSE), 2023-07-19 |
Discover