Verification of on-wafer photoconductive sampling for millimeter wave device characterization = 밀리미터파 소자 측정을 위한 광전도 샘플링 기술의 검증에 관한 연구

Cited 0 time in webofscience Cited 0 time in scopus
  • Hit : 178
  • Download : 0
The development of ultrafast short pulse laser and photoconductive material makes it possible to generate an electrical pulse with a few picoseconds. In addition, with the photoconductive sampling, it is possible to measure the generated electrical short pulse with sub picosecond resolution. In this paper, as reducing the width of the generated electrical pulse, the photoconductive sampling applies for a new millimeter wave measurement technique to surpass the frequency limitation of the extant conventional electrical network analyzer due to the discontinuities of connectors and the lack of millimeter wave sources. To verify the reliability of on-wafer photoconductive sampling as a new measurement technique at millimeter wave region, simple millimeter wave devices with simple coplanar waveguide structure are measured using on-wafer photoconductive sampling. In addition, to confirm the measurement results, these results are compared with current models, FDTD (Finite Difference Time Domain) in time domain, and the commercial software in frequency domain.
Advisors
Kim, Joung-Horesearcher김정호researcher
Description
한국과학기술원 : 전기및전자공학과,
Publisher
한국과학기술원
Issue Date
1999
Identifier
150892/325007 / 000973524
Language
eng
Description

학위논문(석사) - 한국과학기술원 : 전기및전자공학과, 1999.2, [ vi, 55 p. ]

Keywords

Measurement technique; Photoconductive sampling; 광전도 샘플링; 측정기술

URI
http://hdl.handle.net/10203/37203
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=150892&flag=dissertation
Appears in Collection
EE-Theses_Master(석사논문)
Files in This Item
There are no files associated with this item.

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0