학위논문(박사) - 한국과학기술원 : 전기및전자공학부, 2019.2,[iv, 54 p. :]
2.5D/3D IC▼adefect detection▼adefect localization▼aredundancy configuration▼aself-repair▼athrough silicon via; 2.5/3차원 집적회로▼a결함 검출▼a위치 추적▼a중복구성▼a자체 복구▼a관통 실리콘 비아
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