Si-MoS2 Vertical Heterojunction for Photodetector with High Responsivity and Low Noise Equivalent Power

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dc.contributor.authorShin, Gwang Hyukko
dc.contributor.authorPark, Jung Hoonko
dc.contributor.authorLee, Khang Juneko
dc.contributor.authorLee, Geon-Beomko
dc.contributor.authorJeon, Hyun Baeko
dc.contributor.authorChoi, Yang-Kyuko
dc.contributor.authorYu, Kyoungsikko
dc.contributor.authorChoi, Sung-Yoolko
dc.date.accessioned2019-07-18T05:35:58Z-
dc.date.available2019-07-18T05:35:58Z-
dc.date.created2019-01-28-
dc.date.created2019-01-28-
dc.date.created2019-01-28-
dc.date.issued2019-01-
dc.identifier.citationACS APPLIED MATERIALS & INTERFACES, v.11, no.7, pp.7626 - 7634-
dc.identifier.issn1944-8244-
dc.identifier.urihttp://hdl.handle.net/10203/263356-
dc.description.abstractn this study, we propose the fabrication of a photodetector based on the heterostructure of p-type Si and n-type MoS2. Mechanically exfoliated MoS2 flakes are transferred on to a Si layer; the resulting Si-MoS2 p-n photodiode shows excellent performance with a responsivity (R) and detectivity (D*) of 76.1 A/W and 1012 Jones, respectively. In addition, the effect of the thickness of the depletion layer of the Si-MoS2 heterojunction on performance is investigated using the depletion layer model; based on the obtained results, we optimize the photoresponse of the device by varying the MoS2 thickness. Furthermore, low-frequency noise measurement is performed for the fabricated devices. The optimized device shows a low noise equivalent power (NEP) of 7.82×10-15 W Hz-1/2. Therefore, our proposed device could be utilized for various optoelectronic devices for low-light detection.-
dc.languageEnglish-
dc.publisherAMER CHEMICAL SOC-
dc.titleSi-MoS2 Vertical Heterojunction for Photodetector with High Responsivity and Low Noise Equivalent Power-
dc.typeArticle-
dc.identifier.wosid000459642200103-
dc.identifier.scopusid2-s2.0-85061537992-
dc.type.rimsART-
dc.citation.volume11-
dc.citation.issue7-
dc.citation.beginningpage7626-
dc.citation.endingpage7634-
dc.citation.publicationnameACS APPLIED MATERIALS & INTERFACES-
dc.identifier.doi10.1021/acsami.8b21629-
dc.contributor.localauthorChoi, Yang-Kyu-
dc.contributor.localauthorYu, Kyoungsik-
dc.contributor.localauthorChoi, Sung-Yool-
dc.contributor.nonIdAuthorJeon, Hyun Bae-
dc.description.isOpenAccessN-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorMoS2-
dc.subject.keywordAuthorsilicon-
dc.subject.keywordAuthorphotodetector-
dc.subject.keywordAuthorp-n junction-
dc.subject.keywordAuthorheterojunction-
dc.subject.keywordPlusMOS2-
dc.subject.keywordPlusPERFORMANCE-
dc.subject.keywordPlusELECTRONICS-
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