3D Refractive Index Tomogram and Structured Illumination Microscopy System using Wavefront Shaper and Method thereof 파면 제어기를 이용한 초고속 3차원 굴절률 영상 촬영 및 형광 구조화 조도 현미경 시스템 및 이를 이용한 방법

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An ultra-high-speed 3D refractive index tomography and structured illumination microscopy system using a wavefront shaper and a method using the same are provided. A method of using an ultra-high-speed 3D refractive index tomography and structured illumination microscopy system that utilizes a wavefront shaper includes adjusting an irradiation angle of a plane wave incident on a sample by using the wavefront shaper, measuring a 2D optical field, which passes through the sample, based on the irradiation angle of the plane wave, and obtaining a 3D refractive index image from information of the measured 2D optical field by using an optical diffraction tomography or a filtered back projection algorithm.
Assignee
KAIST
Country
US (United States)
Issue Date
2018-09-25
Application Date
2016-08-22
Application Number
15243265
Registration Date
2018-09-25
Registration Number
10,082,662
URI
http://hdl.handle.net/10203/254953
Appears in Collection
PH-Patent(특허)
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