Simultaneous Measurement of Thickness and Permittivity by Means of the Resonant Frequency Fitting of a Microstrip Line Ring Resonator

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A simultaneous measurement method of the thickness and permittivity of a thin and uniform material which is attached onto the top of a sensor structure is presented. The sensor utilizes the fundamental and harmonic frequencies of a microstrip line ring resonator structure. The thickness and permittivity of a material under test are calculated from two simultaneous equations at the fundamental and second-harmonic frequencies. Fitting equations to calculate the peak resonant frequencies with respect to the thickness and permittivity are also derived. The structure is implemented with a microstrip line on the front side of a TLY-5A substrate and coplanar waveguide access lines on the backside. The permittivity and thickness of the test material are successfully measured simultaneously.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2018-06
Language
English
Article Type
Article
Citation

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.28, no.6, pp.539 - 541

ISSN
1531-1309
DOI
10.1109/LMWC.2018.2833202
URI
http://hdl.handle.net/10203/243699
Appears in Collection
EE-Journal Papers(저널논문)
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