High-speed, high-precision focal length measurement using double-hole mask and advanced image sensor software

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A cutting-edge precision technique for computation of focal length of a positive lens with double-hole mask is described. The technique is simple and versatile due to incorporation of the updated functions of image sensor device that supports reading the distance between beam spots instantaneously while the position of the specimen is being changed, as well as the reduction in several challenging measurement steps. Furthermore, this technique does not require prior knowledge of distances in the optical setup. High accuracy in focal-length measurement is obtained by precise beam spot distance analysis using image sensor integrated software. The acquired data exhibit considerably high precision and reproducibility. (C) 2018 ISA. Published by Elsevier Ltd. All rights reserved.
Publisher
ELSEVIER SCIENCE INC
Issue Date
2018-03
Language
English
Article Type
Article
Keywords

GRATING SHEARING INTERFEROMETRY; TALBOT INTERFEROMETRY; MOIRE DEFLECTOMETRY; OPTICAL-SYSTEMS; DIFFRACTION; LENSES; BEAM

Citation

ISA TRANSACTIONS, v.74, pp.239 - 244

ISSN
0019-0578
DOI
10.1016/j.isatra.2018.01.018
URI
http://hdl.handle.net/10203/241534
Appears in Collection
RIMS Journal Papers
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