Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images주사 제벡 현미경 (SSM) 이미지 극소의 해상도를 위한 컴퓨터 지원 시뮬레이션법
A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.
- Assignee
- KAIST
- Country
- US (United States)
- Issue Date
- 2015-07-14
- Application Date
- 2014-06-09
- Application Number
- 14299170
- Registration Date
- 2015-07-14
- Registration Number
- 9081030
- Appears in Collection
- NT-Patent(특허)
- Files in This Item
- There are no files associated with this item.
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