Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images 주사 제벡 현미경 (SSM) 이미지 극소의 해상도를 위한 컴퓨터 지원 시뮬레이션법

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A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.
Assignee
KAIST
Country
US (United States)
Issue Date
2015-07-14
Application Date
2014-06-09
Application Number
14299170
Registration Date
2015-07-14
Registration Number
9081030
URI
http://hdl.handle.net/10203/230984
Appears in Collection
NT-Patent(특허)
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