Computer-aided simulation method for atomic-resolution scanning seebeck microscope (SSM) images 열전 표면영상 전산모사 방법

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A computer-aided simulation method for an atomic-resolution scanning Seebeck microscope (SSM) image is provided. In the computer-aided simulation method, a computer may calculate a local thermoelectric voltage for a position of a voltage probe, to acquire an SSM image corresponding to the position.
Assignee
KAIST
Country
US (United States)
Issue Date
2016-10-04
Application Date
2015-07-06
Application Number
14791732
Registration Date
2016-10-04
Registration Number
9459278
URI
http://hdl.handle.net/10203/230351
Appears in Collection
NT-Patent(특허)
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