Poisson's ratio of BiFeO3 thin films: X-ray reciprocal space mapping under variable uniaxial strain

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We investigate the mechanical properties of BiFeO3 (BFO) thin films grown on SrTiO3 (001) substrates that were manually bent using a specially designed uniaxial bending stage. X-ray measurements under variable uniaxial strain show that excessive strains up to approximate to 2% could be applied along the [100] direction with little cross talk between [100] and [010] directions. X-ray reciprocal space maps were acquired to investigate the evolution of -a and c-axis lattice constants under variable strain and Poisson's ratio of BFO thin films v(zx) was determined to be 0.30 +/- 0.01.
Publisher
WILEY-V C H VERLAG GMBH
Issue Date
2017-01
Language
English
Article Type
Article
Keywords

THERMAL-EXPANSION COEFFICIENT; DOMAIN-WALLS; EPITAXIAL STRAIN; DOPED BIFEO3; CRYSTAL; OXIDE; STRESS

Citation

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, v.214, no.1, pp.1600356

ISSN
1862-6300
DOI
10.1002/pssa.201600356
URI
http://hdl.handle.net/10203/223339
Appears in Collection
PH-Journal Papers(저널논문)
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