Lead-free 0.75(Bi0.5Na0.5)TiO3-0.25SrTiO(3) (BNT-ST) epitaxial films grown on Si (001) substrates via pulsed laser deposition
Lead-free BNT-ST and La0.5Ni0.5O3 (LNO) bottom electrode films were epitaxially grown onto CeO2/YSZ (yttria stabilized zirconia) buffered Si (001) substrates via pulsed laser deposition. The lattice alignment of CeO2/YSZ and BNT-ST/LNO showed 45 degrees twisted cube-on-cube epitaxial relationship, indicating high crystallinity for the BNT-ST and LNO films. The constituent elements in the BNT-ST/LNO/CeO2/YSZ structure showed no distinct diffusion between the layers. The BNT-ST epitaxial films demonstrated ferroelectric properties, but exhibited a high degree of leakage current density. (C) 2016 Elsevier B.V. All rights reserved
- Publisher
- ELSEVIER SCIENCE SA
- Issue Date
- 2016-06
- Language
- English
- Article Type
- Article
- Keywords
PZT THIN-FILMS; PIEZOELECTRIC COEFFICIENT; FERROELECTRIC CERAMICS; BEHAVIOR; DENSITY; LANIO3; D(31)
- Citation
SENSORS AND ACTUATORS A-PHYSICAL, v.243, pp.117 - 122
- ISSN
- 0924-4247
- Appears in Collection
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