Equivalent Circuit Modeling of Dielectric Hysteresis Loops in Through Silicon Vias

Cited 8 time in webofscience Cited 9 time in scopus
  • Hit : 256
  • Download : 0
This paper proposes a numerical solution of the nonlinear equations that describes the hysteretic behavior of the coupling capacitance among through silicon vias in three-dimensional integrated circuits. Behavioral ordinary differential equations are formulated and solved by an equivalent circuit described in SPICE syntax. These results are then compared with those obtained by measurements.
Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Issue Date
2015-12
Language
English
Article Type
Article
Keywords

COMPUTATIONAL ELECTROMAGNETICS CEM; SELECTIVE VALIDATION FSV; THROUGH-SILICON; PERFORMANCE

Citation

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.57, no.6, pp.1510 - 1516

ISSN
0018-9375
DOI
10.1109/TEMC.2015.2478849
URI
http://hdl.handle.net/10203/207836
Appears in Collection
EE-Journal Papers(저널논문)
Files in This Item
There are no files associated with this item.
This item is cited by other documents in WoS
⊙ Detail Information in WoSⓡ Click to see webofscience_button
⊙ Cited 8 items in WoS Click to see citing articles in records_button

qr_code

  • mendeley

    citeulike


rss_1.0 rss_2.0 atom_1.0