Determination of the off-diagonal element of the dielectric tensor without measuring the ellipticity

Abstract

In addition to the measurement of the Kerr rotation angle, the measurement of the ellipticity is generally known to be necessary for determining the off-diagonal element of the dielectric tenser. We have found a new method for determining the off-diagonal element of the dielectric tensor, without measuring the ellipticity, for a sample deposited on a transparent substrate. (C) 1996 American Institute of Physics.