ROIC with Self-Calibration skimming for SWIR MCT arrays on Si substrates

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Publisher
EPIR Technologies
Issue Date
2015-10-08
Language
ENG
Citation

The U.S. Workshop on the physics and chemistry of II-VI materials

URI
http://hdl.handle.net/10203/204311
Appears in Collection
EE-Conference Papers(학술회의논문)
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