Microstructural and electrical properties of lead-free 0.5Ba(Zr0.2Ti0.8)O-3-0.5(Ba0.7Ca0.3)TiO3 (BZT-BCT) epitaxial films grown on Si (001) substrates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Choi, Min-Ju | ko |
| dc.contributor.author | Lim, Jae-Ryung | ko |
| dc.contributor.author | Choi, Jin-Suck | ko |
| dc.contributor.author | Eom, Ji-Ho | ko |
| dc.contributor.author | Park, Byung-Ju | ko |
| dc.contributor.author | Kim, Kyung-Soo | ko |
| dc.contributor.author | Kim, Dojin | ko |
| dc.contributor.author | Yoon, Soon-Gil | ko |
| dc.date.accessioned | 2016-04-15T02:56:42Z | - |
| dc.date.available | 2016-04-15T02:56:42Z | - |
| dc.date.created | 2015-09-21 | - |
| dc.date.created | 2015-09-21 | - |
| dc.date.issued | 2015-11 | - |
| dc.identifier.citation | SCRIPTA MATERIALIA, v.108, pp.96 - 99 | - |
| dc.identifier.issn | 1359-6462 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/203846 | - |
| dc.description.abstract | Lead-free 0.5Ba(Zr0.2Ti0.8)O-3-0.5(Ba0.7Ca0.3)TiO3 (BZT BCT) and the La0.5Sr0.5CoO3 (LSCO) bottom electrode films were epitaxially grown onto the CeO2/Y0.15Zr0.85O1.93 (YSZ) buffered Si (001) substrates via pulsed laser deposition. The lattice alignments between CeO2/YSZ and BZT BCTILSCO showed a 450 twisted cube-on-cube epitaxial relationship, indicating a high crystallinity of the BZT BCT and LSCO films. The constituent elements in the BZT BCT/LSCO/CeO2/YSZ structure showed no distinct inter-diffusion between each layer. The BZT BCT epitaxial films showed a well saturation of the polarization electric field (P-E). | - |
| dc.language | English | - |
| dc.publisher | PERGAMON-ELSEVIER SCIENCE LTD | - |
| dc.subject | PZT THIN-FILMS | - |
| dc.subject | PIEZOELECTRIC COEFFICIENT | - |
| dc.subject | D(31) | - |
| dc.title | Microstructural and electrical properties of lead-free 0.5Ba(Zr0.2Ti0.8)O-3-0.5(Ba0.7Ca0.3)TiO3 (BZT-BCT) epitaxial films grown on Si (001) substrates | - |
| dc.type | Article | - |
| dc.identifier.wosid | 000360250700024 | - |
| dc.identifier.scopusid | 2-s2.0-84939773318 | - |
| dc.type.rims | ART | - |
| dc.citation.volume | 108 | - |
| dc.citation.beginningpage | 96 | - |
| dc.citation.endingpage | 99 | - |
| dc.citation.publicationname | SCRIPTA MATERIALIA | - |
| dc.identifier.doi | 10.1016/j.scriptamat.2015.06.026 | - |
| dc.contributor.nonIdAuthor | Choi, Min-Ju | - |
| dc.contributor.nonIdAuthor | Lim, Jae-Ryung | - |
| dc.contributor.nonIdAuthor | Eom, Ji-Ho | - |
| dc.contributor.nonIdAuthor | Park, Byung-Ju | - |
| dc.contributor.nonIdAuthor | Kim, Kyung-Soo | - |
| dc.contributor.nonIdAuthor | Kim, Dojin | - |
| dc.contributor.nonIdAuthor | Yoon, Soon-Gil | - |
| dc.type.journalArticle | Article | - |
| dc.subject.keywordAuthor | Lead-free BZT-BCT epitaxial films | - |
| dc.subject.keywordAuthor | CeO2/YSZ buffered Si (001) substrate | - |
| dc.subject.keywordAuthor | Pulsed laser deposition | - |
| dc.subject.keywordAuthor | Crystallinity | - |
| dc.subject.keywordAuthor | Electrical property | - |
| dc.subject.keywordPlus | PZT THIN-FILMS | - |
| dc.subject.keywordPlus | PIEZOELECTRIC COEFFICIENT | - |
| dc.subject.keywordPlus | D(31) | - |
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