A 0.18 ㎛ Radiation Hardening Shift Register using Guard Gate technique to Reduce SEUs

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Publisher
IEIE
Issue Date
2014-11-04
Language
English
Citation

ISOCC(International SoC Design Conference) 2014

URI
http://hdl.handle.net/10203/192136
Appears in Collection
EE-Conference Papers(학술회의논문)
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