ENIG 표면처리 시 발생되는 Black Pad 현상의 발생기구 및 UBM의 영향에 관한 연구A study on the mechanisms of black pad formation and the effects of UBM on black pad after ENIG process

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Advisors
유진researcherYu, Jin
Description
한국과학기술원 : 신소재공학과,
Publisher
한국과학기술원
Issue Date
2011
Identifier
490157/325007  / 020093138
Language
kor
Description

학위논문(석사) - 한국과학기술원 : 신소재공학과, 2011.2, [ viii, 62 p. ]

Keywords

무전해 니켈/치환 금도금; 블랙패드; 이종금속접촉부식; 하부 금속층; black pad; electroless nickel immersion gold (ENIG) process; galvanic corrosion; under bump metallurgy (UBM); surface finish; 표면처리

URI
http://hdl.handle.net/10203/182011
Link
http://library.kaist.ac.kr/search/detail/view.do?bibCtrlNo=490157&flag=dissertation
Appears in Collection
MS-Theses_Master(석사논문)
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