DC Field | Value | Language |
---|---|---|
dc.contributor.author | Roh Y.J. | - |
dc.contributor.author | Ko K.W. | - |
dc.contributor.author | Cho, Hyungsuck | - |
dc.contributor.author | Kim H.C. | - |
dc.contributor.author | Joo H.N. | - |
dc.contributor.author | Kim S.K. | - |
dc.date.accessioned | 2007-10-02T08:11:40Z | - |
dc.date.available | 2007-10-02T08:11:40Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1999-09-21 | - |
dc.identifier.citation | Proceedings of the 1999 Machine Vision Systems for Inspection and Metrology VIII, v.3836, no., pp.168 - 178 | - |
dc.identifier.issn | 0277-786X | - |
dc.identifier.uri | http://hdl.handle.net/10203/1607 | - |
dc.description | Copyright 1999 Society of Photo-Optical Instrumentation Engineers. | en |
dc.language | ENG | - |
dc.language.iso | en_US | en |
dc.publisher | International Society for Optical Engineering (SPIE) | - |
dc.title | Inspection of ball grid array (BGA) solder joints using X-ray cross-sectional images | - |
dc.type | Conference | - |
dc.identifier.scopusid | 2-s2.0-0033334669 | - |
dc.type.rims | CONF | - |
dc.citation.volume | 3836 | - |
dc.citation.beginningpage | 168 | - |
dc.citation.endingpage | 178 | - |
dc.citation.publicationname | Proceedings of the 1999 Machine Vision Systems for Inspection and Metrology VIII | - |
dc.identifier.conferencecountry | United States | - |
dc.identifier.conferencecountry | United States | - |
dc.contributor.localauthor | Cho, Hyungsuck | - |
dc.contributor.nonIdAuthor | Roh Y.J. | - |
dc.contributor.nonIdAuthor | Ko K.W. | - |
dc.contributor.nonIdAuthor | Kim H.C. | - |
dc.contributor.nonIdAuthor | Joo H.N. | - |
dc.contributor.nonIdAuthor | Kim S.K. | - |
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