분산형 백색광 간섭계를 이용한 박막 두께 측정Dispersive White-light Interferometry for Thin-film Thickness Measurement
- Publisher
- 한국광학회
- Issue Date
- 2005-07-14
- Language
- KOR
- Citation
한국광학회 2005년도 하계학술발표회, pp.24 - 25
- Appears in Collection
- ME-Conference Papers(학술회의논문)
- Files in This Item
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.