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Color three-dimensional imaging based on patterned illumination using a negative pinhole array Kim, Chang-Soo; Kim, Junyoung; Yoo, Hongki, OPTICS EXPRESS, v.29, no.5, pp.6509 - 6522, 2021-02 |
Pixel-by-pixel absolute three-dimensional shape measurement with modified Fourier transform profilometry Yun, Huitaek; Li, Beiwen; Zhang, Song, APPLIED OPTICS, v.56, no.5, pp.1472 - 1480, 2017-02 |
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