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Showing results 1 to 6 of 6

1
Chromatic confocal microscopy with a novel wavelength detection method using transmittance

Kim, Taejoong; Kim, Sang Hoon; Do, DukHo; Yoo, Hongki; Gweon, Dae-Gab, OPTICS EXPRESS, v.21, no.5, pp.6286 - 6294, 2013-03

2
Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms

Park, MC; Kim, Seung-Woo, OPTICAL ENGINEERING, v.39, no.4, pp.952 - 959, 2000-04

3
Femtosecond laser pulses for fast 3-D surface profilometry of microelectronic step-structures

Joo, Woo-Deok; Kim, Seung-Man; Park, Ji-Yong; Lee, Keun-Woo; Lee, Joo-Hyung; Kim, Seung-Chul; KIM, Young-Jin; et al, OPTICS EXPRESS, v.21, no.13, pp.15323 - 15334, 2013-07

4
High-speed 3-D measurement with a large field of view based on direct-view confocal microscope with an electrically tunable lens

Jeong, Hyeong Jun; Yoo, Hongki; Gweon, DaeGab, OPTICS EXPRESS, v.24, no.4, pp.3806 - 3816, 2016-02

5
High-speed color three-dimensional measurement based on parallel confocal detection with a focus tunable lens

Kim, Chang-Soo; Kim, Wooseop; Lee, Kyuhang; Yoo, Hongki, OPTICS EXPRESS, v.27, no.20, pp.28466 - 28479, 2019-09

6
Phase shifting interferometry for large-sized surface measurements by sweeping the repetition rate of femtosecond light pulses

Joo, Woo-Deok; Park, Ji-Yong; Kim, Seung-Man; Kim, Seung-Chul; Kim, Yun-Seok; Kim, Seung-Woo; KIM, Young-Jin, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.14, no.2, pp.241 - 246, 2013-02

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