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Design and evaluation of two dimensional metrological atomic force microscope using a planar nanoscanner Lee D.-Y.; Kim D.-M.; Gweon, Dae-Gab, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, v.45, no.3B, pp.2124 - 2127, 2006 |
Fabrication of a high-aspect-ratio nano tip integrated micro cantilever with a ZnO piezoelectric actuator Lee, SH; Lee, Seung Seob; Choi, JJ; Jeon, JU; Ko, R, ADVANCES IN NONDESTRUCTIVE EVALUATION, PT 1-3 BOOK SERIES: KEY ENGINEERING MATERIALS, v.270-273, pp.1 - 3, 2004 |
Fabrication of a ZnO piezoelectric micro cantilever with a high-aspect-ratio nano tip Lee, SH; Lee, Seung Seob; Choi, JJ; Jeon, JU; Ro, K, MICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMS, v.11, no.6, pp.416 - 423, 2005-05 |
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