Browse "Dept. of Mechanical Engineering(기계공학과)" by Subject PROFILOMETRY

Showing results 1 to 12 of 12

1
3D profiling of rough silicon carbide surfaces by coherence scanning interferometry using a femtosecond laser

Lu, Yang; Park, Jiyong; Yu, Liandong; Kim, Seung-Wooresearcher, APPLIED OPTICS, v.57, no.10, pp.2584 - 2589, 2018-03

2
Compensation of phase change on reflection in white-light interferometry for step height measurement

Park, MC; Kim, Seung-Wooresearcher, OPTICS LETTERS, v.26, no.7, pp.420 - 422, 2001-04

3
Determination of film thickness and surface profile using reflectometry and spectrally resolved phase shifting interferometry

You, Joonho; Debnath, Sanjit Kumar; Kim, Seung-Wooresearcher, INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, v.10, no.5, pp.5 - 10, 2009-12

4
Direct quadratic polynomial fitting for fringe peak detection of white light scanning interferograms

Park, MC; Kim, Seung-Wooresearcher, OPTICAL ENGINEERING, v.39, no.4, pp.952 - 959, 2000-04

5
Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques

Debnath, Sanjit K.; Kothiyal, Mahendra P.; Kim, Seung-Wooresearcher, OPTICS AND LASERS IN ENGINEERING, v.47, no.11, pp.1125 - 1130, 2009-11

6
High-speed color three-dimensional measurement based on parallel confocal detection with a focus tunable lens

Kim, Chang-Soo; Kim, Wooseop; Lee, Kyuhang; Yoo, Hongkiresearcher, OPTICS EXPRESS, v.27, no.20, pp.28466 - 28479, 2019-09

7
Rigorous single pulse imaging for ultrafast interferometric observation

Kim, Daehee; Lu, Yang; Park, Jiyong; Kim, Byunggi; Yan, Liping; Yu, Liandong; Joo, Ki-Nam; et al, OPTICS EXPRESS, v.27, no.14, pp.19758 - 19767, 2019-07

8
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate

Debnath, Sanjit K.; Kim, Seung-Wooresearcher; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12

9
Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

Kim, Seung-Wooresearcher; Kim, GH, APPLIED OPTICS, v.38, no.28, pp.5968 - 5973, 1999-10

10
Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry

Ghim, Young-Sik; Kim, Seung-Wooresearcher, OPTICS EXPRESS, v.14, no.24, pp.11885 - 11891, 2006-11

11
Time-of-flight detection of femtosecond laser pulses for precise measurement of large microelectronic step height

Lu, Xing; Zhang, Shuangyou; Jeon, Chan-Gi; Kang, Chu-Shik; Kim, Jungwonresearcher; Shi, Kebin, OPTICS LETTERS, v.43, no.7, pp.1447 - 1450, 2018-04

12
White light on-axis digital holographic microscopy based on spectral phase shifting

Kim, D; You, JW; Kim, Soohyunresearcher, OPTICS EXPRESS, v.14, no.1, pp.229 - 234, 2006-01

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