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785-nm Frequency Comb-Based Time-of-Flight Detection for 3D Surface Profilometry of Silicon Devices Kwak, Hyunsoo; Ahn, Changmin; Na, Yongjin; Bae, Jinho; Kim, Jungwon, IEEE PHOTONICS JOURNAL, v.14, no.5, 2022-10 |
Computational study of geometry induced effect on the phonon transport in nanostructure = 나노 구조에서 형상에 따른 전도열전달에 관한 연구link Dulhani, Jay Prakash; Lee, Bong Jae; et al, 한국과학기술원, 2016 |
Optimization of deep reactive ion etching for microscale silicon hole arrays with high aspect ratio Kim, Taeyeong; Lee, Jungchul, MICRO AND NANO SYSTEMS LETTERS, v.10, no.1, 2022-09 |
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