Novel top-surface imaging process by selective chemisorption of poly(dimethyl siloxane) on diazoketo-functionalized single component photoresist

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A novel top-surface imaging process was successfully established using selective chemisorption of amine-functionalized poly(dimethly siloxane) onto the carboxylic groups formed on the surace of diazoketo-functionalized polymer film by UV light irradiation. The chemisorbed poly(dimethyl siloxane) worked as an efficient etch mask for the subsequent oxygen plasma etching process for pattern generation. High-resolution patterns were resolved with the new imaging process.
Publisher
WILEY-V C H VERLAG GMBH
Issue Date
2008-03
Language
English
Article Type
Article
Keywords

NONCHEMICALLY AMPLIFIED RESIST; POSITIVE RESIST; ELECTRON-BEAM; LITHOGRAPHY; FILMS; SYSTEM; FABRICATION; ATTACHMENT; NM

Citation

MACROMOLECULAR RAPID COMMUNICATIONS, v.29, no.5, pp.437 - 441

ISSN
1022-1336
DOI
10.1002/marc.200700694
URI
http://hdl.handle.net/10203/10928
Appears in Collection
CH-Journal Papers(저널논문)
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