The beam divergence of an indium LMIS at a distance of 50 mu m as determined by plasma diagnostic measurements

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The current-dependent beam divergence at a distance of 50 pm from an indium-liquid metal ion source is derived from experimental data obtained by measuring the beam spread with a 3D Plasma diagnostic system at a distance of 10 cm from the needle tip. The observed relationship between emission current and beam divergence in vicinity of the emitting needle is used to design a focusing electrode for a field-emission electric propulsion thruster operating at currents up to 150 mu A. Another application involves focused ion beam columns which may choose to forego a beam-limiting aperture, such as LMIS-based rapid machining tools with large beam currents. (C) 2011 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2011-07
Language
English
Article Type
Article
Keywords

METAL ION-SOURCE

Citation

ULTRAMICROSCOPY, v.111, no.8, pp.969 - 972

ISSN
0304-3991
DOI
10.1016/j.ultramic.2011.01.040
URI
http://hdl.handle.net/10203/102977
Appears in Collection
ME-Journal Papers(저널논문)
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