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Showing results 43061 to 43080 of 275787
| Characterization of Sepharose-bound Pronase 배은옥; 변시명, 한국식품과학회지, v.8, no.4, pp.253 - 259, 1976 |
| Characterization of shared files in peer-to-peer network : lifetime, incompleteness, and pollution = P2P 네트워크에서 파일의 유효성, 불완전성, 훼손성에 대한 분석link Lee, Seung-Jun; 이승준; et al, 한국과학기술원, 2005 |
| Characterization of Si-PIN radiation detector with photon counting mode CMOS readout front-end Jeon, Sungehae; Huh, Young; Jin, Seongoh; Park, Jongduk; Lee, Jae Yun; Kang, Bo Sun; Cho, Gyuseong, NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.576, no.1, pp.47 - 51, 2007-06 |
| Characterization of Sidewall Residue Film and Atomic Structure of the Trench Formed by BCl3/Cl2 Reactive Ion Etching Lee, Jeong Yong, Materials Research Society, pp.431 - 431, 1990-12-01 |
| Characterization of silicon photomultipliers at National Nano-Fab Center for PET-MR Kim, Hyoungtaek; Sul, Woo Suk; Cho, Gyu-Seong, REVIEW OF SCIENTIFIC INSTRUMENTS, v.85, no.10, 2014-10 |
| Characterization of silicon scanning mirror for laser display Lee, JH; Ko, YC; Choi, BS; Kim, JM; Jeon, DukYoung, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.41, no.9, pp.5853 - 5857, 2002-09 |
| CHARACTERIZATION OF SILICON SURFACE CONTAMINATION AND NEAR-SURFACE DAMAGE CAUSED BY C2F6 CHF3 REACTIVE ION ETCHING YUN, SJ; PARK, SJ; PAEK, MC; Lee, JeongYong, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.137, no.8, pp.2634 - 2639, 1990-08 |
| Characterization of silicon-on-insulator metal-oxide-semiconductor transistors = 에스오아이 금속-산화막-반도체 트랜지스터의 특성 분석link Lyu, Jong-Son; 유종선; et al, 한국과학기술원, 1993 |
| Characterization of Simplicial Complexes by Counting Simplets Beyond Four Nodes Kim, Hyunju; Ko, Jihoon; Bu, Fanchen; Shin, Kijung, 2023 World Wide Web Conference, WWW 2023, pp.317 - 327, Association for Computing Machinery, Inc, 2023-05-02 |
| Characterization of Simulated Production Welds in Alloy 908 Jang, Changheui, Advances on Cryogenic Engineering, 1996-07-15 |
| Characterization of Single and Dual Section SFTs through 2-D Wave Flume Experiment Kim, Gyu-Jin; Kwak, Hyo-Gyoung, The 2022 World Congress on Advances in Civil, Environmental, & Materials Research (ACEM22)/ The 2022 Structures Congress (Structures22), Techno-Press, 2022-08-19 |
| Characterization of single and dual SFT through a hydraulic experiment under regular and irregular waves Kim, Gyu-Jin; 이상민; Kim, Mujong; Kwak, Hyo-Gyoung; Hong, Jung-Wuk, OCEAN ENGINEERING, v.263, 2022-11 |
| Characterization of SIngle Coal Particle Flames Choi, Sangmin, The 7th Korea-U.S. Coal Utilization Workshop, 1992 |
| Characterization of site-specific recombination mediated by Cre recombinase during the development of erythropoietin producing CHO cell lines Kim, Min-Soo; Kim, Won-Hee; Lee, Gyun-Min, BIOTECHNOLOGY AND BIOPROCESS ENGINEERING, v.13, no.4, pp.418 - 423, 2008-07 |
| Characterization of Slit Type Nozzle for Electrospray Method Kim. Hongseok; Kim, Sang Soo, International Aerosol Conference 2014, International Aerosol Conference, 2014-08-29 |
| Characterization of Small Cobalt Clusters in CoNaY Facilitated by Reduction-Oxidation Cycles Kim, JC; Woo, Seong-Ihl; Kim, YG, 한국화학공학회 추계학술발표회, 한국화학공학회, 1987-10 |
| Characterization of small-sized eutectic Sn-Bi solder bumps fabricated using electroplating Jung, HR; Kim, HH; Lee, Won-Jong, JOURNAL OF ELECTRONIC MATERIALS, v.35, no.5, pp.1067 - 1073, 2006-05 |
| Characterization of SnO2 ceramic gas sensor for exhaust gas monitoring of SVE process Yang, Ji-Won; Cho, HJ; Lee, SH; Lee, JY, ENVIRONMENTAL MONITORING AND ASSESSMENT, v.92, no.1-3, pp.153 - 161, 2004-03 |
| Characterization of soft handoff in CDMA systems Kim, DK; Sung, Dan Keun, IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY, v.48, no.4, pp.1195 - 1202, 1999-07 |
| Characterization of soil properties using elastic and electromagnetic waves Cho, Gye-Chun; Lee, Seung-Rae; Kwon, Tae-Hyuk, Smart Structures and Materials 2003: Smart Systems and Nondestructive Evaluation for Civil Infrastructures, pp.440 - 450, SPIE, 2003-03-03 |
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