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Effect of the microstructureOf Si3N4 on the adhesion strength of TiN film on Si3N4 Kim, YG; Tatami, J; Komeya, K; Kim, Do Kyung, THIN SOLID FILMS, v.510, pp.222 - 228, 2006-07 |
In situ observation of fracture sequence of physical vapor deposited TiN film on (11(2)over-bar-0) sapphire Kim, YG; Kim, Do Kyung, JOURNAL OF MATERIALS RESEARCH, v.20, no.6, pp.1389 - 1395, 2005-06 |
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