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Showing results 1 to 4 of 4

1
Etching behavior and damage recovery of SrBi2Ta2O9 thin films

Lee, WJ; Cho, CR; Kim, SH; You, IK; Kim, BW; Yu, BG; Shin, CH; et al, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.38, no.12A, pp.1428 - 1431, 1999-12

2
Ferroelectric properties of (Bi, SM)(4)Ti3O12 (BST) thin films fabricated by a metalorganic solution deposition method

Kim, SS; Choi, EK; Kim, HJ; Park, MH; Lee, HS; Kim, WJ; Bae, JC; et al, JOURNAL OF ELECTROCERAMICS, v.13, pp.83 - 88, 2004-07

3
Influence of High-Pressure Annealing Conditions on Ferroelectric and Interfacial Properties of Zr-Rich HfxZr1-xO2 Capacitors

Das, Dipjyoti; Buyantogtokh, Batzorig; Gaddam, Venkateswarlu; Jeon, Sanghun, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.4, pp.1996 - 2002, 2021-04

4
Microstructure and ferroelectric properties of (Bi,Nd)(4)Ti3O12 thin films fabricated by a sol-gel process

Kim S.S.; Choi E.K.; Park M.H.; Kim H.J.; Lee H.S.; Kim W.-J.; Bae J.C.; et al, FERROELECTRICS, v.328, pp.139 - 143, 2005

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