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Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS Kim, HO; Lee, BH; Kim, JT; Choi, JY; Choi, KM; Shin, Youngsoo, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.18, no.3, pp.505 - 509, 2010-03 |
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