Browse by Subject product quality control
Showing results 1 to 3 of 3
| Building inferential prediction models of batch processes using subspace identification Dorsey, AW; Lee, JayHyung, JOURNAL OF PROCESS CONTROL, v.13, no.5, pp.397 - 406, 2003-08 |
| Estimation of silicon wafer coating thickness using ultrasound generated by femtosecond laser Liu, Peipei; Yi, Kiyoon; Sohn, Hoon, Journal of Nondestructive Evaluation, Diagnostics and Prognostics of Engineering Systems, v.4, no.1, pp.1 - 21, 2021-01 |
| Inferential product quality control of a multistage batch plant Lee, JayHyung; Dorsey, AW; Russell, S, AICHE JOURNAL, v.50, no.1, pp.136 - 148, 2004-01 |
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