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Showing results 1 to 3 of 3

1
Effects of Bottom Polysilicon Doping on the Reliability of Interpoly Oxide Grown by Using Electron Cyclotron Resonance N2O-Plasma

N-I Lee; J-W Lee; S-H Hur; H-S Kim; C-H Han, JAPANESE JOURNAL OF APPLIED PHYSICS, v.37, no.3B, pp.1125 - 1128, 1998-01

2
Endurance characteristics and degradation mechanism of polysilicon thin film transistor EEPROMs with electron cyclotron resonance NaO-plasma gate oxide

Lee, NI; Lee, JW; Han, Chul-Hi, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.38, no.4B, pp.2215 - 2218, 1999-04

3
Nonvolatile Memories Based on Graphene and Related 2D Materials

Bertolazzi, Simone; Bondavalli, Paolo; Roche, Stephan; San, Tamer; Choi, Sung-Yool; Colombo, Luigi; Bonaccorso, Francesco; et al, ADVANCED MATERIALS, v.31, no.10, pp.1806663, 2019-03

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