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Nondestructive Measurement of Critical Current Distribution of SmBCO Coated Conductor Using Hall Probe Kim, HS; Oh, SS; Lee, NJ; Baik, SK; Ha, DW; Ko, RK; Ha, HS; et al, IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, v.20, pp.1537 - 1540, 2010-06 |
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