Browse by Subject inversion-mode (IM) FET

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Comprehensive Analysis of Gate-Induced Drain Leakage in Vertically Stacked Nanowire FETs: Inversion-Mode Versus Junctionless Mode

Hur, Jae; Lee, Byung-Hyun; Kang, Min-Ho; Ahn, Dae-Chul; Bang, Tewook; Jeon, Seung-Bae; Choi, Yang-Kyuresearcher, IEEE ELECTRON DEVICE LETTERS, v.37, no.5, pp.541 - 544, 2016-05

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