Browse by Subject hysteresis behavior

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Analysis of Drain-Induced Barrier Rising in Short-Channel Negative-Capacitance FETs and Its Applications

Seo, Junbeom; Lee, Jaehyun; Shin, Mincheolresearcher, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.4, pp.1793 - 1798, 2017-04

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