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Characterization of Grain Boundaries in Cu(In,Ga)Se-2 Films Using Atom-Probe Tomography Cojocaru-Miredin, Oana; Choi, Pyuck-Pa; Abou-Ras, Daniel; Schmidt, Sebastian S.; Caballero, Raquel; Raabe, Dierk, IEEE JOURNAL OF PHOTOVOLTAICS, v.1, no.2, pp.207 - 212, 2011-10 |
Investigation of sputter-deposited Al-2at.%Cu layers by means of the tomographic atom probe (TAP) Choi, Pyuck-Pa; Al-Kassab, Talaat; Kirchheim, Reiner, SCRIPTA MATERIALIA, v.53, no.3, pp.323 - 327, 2005-08 |
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