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Showing results 1 to 6 of 6

1
A Transparent Logic Circuit for RFID Tag in a-IGZO TFT Technology

Yang, Byung-Do; Oh, JM; Kang, Hyeong-Ju; Park, SH; Hwang, CS; Ryu, MK; Pi, JE, ETRI JOURNAL, v.35, no.4, pp.610 - 616, 2013-08

2
Drain bias effect on the instability of amorphous indium gallium zinc oxide thin film transistor

Seo, Seung-Bum; Park, Han-Sung; Jeon, Jae-Hong; Choe, Hee-Hwan; Seo, Jong-Hyun; Yang, Shinhyuk; Park, Sang-Hee Ko, THIN SOLID FILMS, v.547, no.29, pp.263 - 266, 2013-11

3
Negative Gate Bias and Light Illumination-Induced Hump in Amorphous InGaZnO Thin Film Transistor

Jeon, Jae-Hong; Seo, Seung-Bum; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Kee-Chan; Park, Sang-Hee Ko, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.13, no.11, pp.7535 - 7539, 2013-11

4
Stability of a-InGaZnO thin film transistor under pulsed gate bias stress

Seo, Seung-Bum; Jeon, Jae-Hong; Park, Han-Sung; Choe, Hee-Hwan; Seo, Jong-Hyun; Park, Sang-Hee Ko, THIN SOLID FILMS, v.521, pp.212 - 215, 2012-10

5
Water-Soluble Thin Film Transistors and Circuits Based on Amorphous Indium-Gallium-Zinc Oxide

Jin, Sung Hun; Kang, Seung-Kyun; Cho, In-Tak; Han, Sang Youn; Chung, Ha Uk; Lee, Dong Joon; Shin, Jongmin; et al, ACS APPLIED MATERIALS & INTERFACES, v.7, no.15, pp.8268 - 8274, 2015-04

6
저온 공정 a-IGZO 투명 유연 박막 트랜지스터의 특성 및 신뢰성 향상을 위한 줄 발열 열처리 = Electro-thermal annealing for advanced performance and stabilities of low temperature fabricated transparent and flexible a-IGZO thin film transistorslink

이명근; 최경철; Choi, Kyung Cheol; 박상희; et al, 한국과학기술원, 2017

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