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Showing results 1 to 4 of 4

1
High-speed 3-D measurement with a large field of view based on direct-view confocal microscope with an electrically tunable lens

Jeong, Hyeong Jun; Yoo, Hongki; Gweon, DaeGab, OPTICS EXPRESS, v.24, no.4, pp.3806 - 3816, 2016-02

2
Large-aperture ground glass surface profile measurement using coherence scanning interferometry

Bae, Eun Deok; Kim, Yunseok; Park, Sang-Wook; Kim, Seung-Woo, OPTICS EXPRESS, v.25, no.2, pp.1106 - 1113, 2017-01

3
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometer

You, JW; Kim, D; Ryu, SY; Kim, Soohyun, OPTICS EXPRESS, v.17, no.3, pp.1352 - 1360, 2009-02

4
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate

Debnath, Sanjit K.; Kim, Seung-Woo; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12

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