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Showing results 1 to 3 of 3

1
A study of morphological evolution of silicon microstructure based on phase field model

Zhang, Linan; Zheng, Wei; Lee, Jungchul; Wu, Liqun; Kim, Dongchoul, FERROELECTRICS, v.520, no.1, pp.154 - 158, 2017

2
Applicability of step-coverage Modeling to TiO2 thin films in atomic layer deposition

Kim, Ja-Yong; Kim, Jin-Hyock; Ahn, Ji-Hoon; Park, Pan-Kwi; Kang, Sang-Won, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.154, no.12, pp.H1008 - H1013, 2007

3
Step coverage modeling of thin films in atomic layer deposition

Kim, Ja-Yong; Ahn, Ji-Hoon; Kang, Sang-Won; Kim, Jin-Hyock, JOURNAL OF APPLIED PHYSICS, v.101, no.7, 2007-04

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