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Showing results 1 to 12 of 12

1
Annealing of Fowler-Nordheim stress-induced leakage currents in thin silicon dioxide films

Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung Jin, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.147, no.12, pp.4676 - 4682, 2000-12

2
Comprehensive modeling of resistive switching in the Al/TiOx/TiO2/Al heterostructure based on space-charge-limited conduction

Kim, Sung-Ho; Jeong, Hu-Young; Choi, Sung-Yool; Choi, Yang-Kyu, APPLIED PHYSICS LETTERS, v.97, no.3, 2010-07

3
Excluded volume effect on diffusion-influenced reactions in one dimension

Park, Joonho; Kim, H; Shin, Kook Joe, JOURNAL OF CHEMICAL PHYSICS, v.118, no.21, pp.9697 - 9703, 2003-06

4
Experimental evidence of interface-controlled mechanism of quasi-breakdown in ultrathin gate oxide

Guan, H; Cho, Byung Jin; Li, MF; Xu, Z; He, YD; Dong, Z, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.48, no.5, pp.1010 - 1013, 2001-05

5
In Situ Electrodeposition of Gold Nanostructures in 3D Ultra-Thin Hydrogel Skins for Direct Molecular Detection in Complex Mixtures with High Sensitivity

Ansah, Iris Baffour; Kim, Sunho; Yang, Jun-Yeong; Mun, ChaeWon; Jung, Ho Sang; Lee, Seunghun; Kim, Dong-Ho; et al, LASER & PHOTONICS REVIEWS, v.15, no.12, 2021-12

6
Interface states in In0.5Ga0.5P/AlxGa1-xAs heterostructures grown by liquid phase epitaxy

Cho, Yong-Hoon; Choe, BD; Kim, Y; Lim, H, JOURNAL OF APPLIED PHYSICS, v.81, no.11, pp.7362 - 7366, 1997-06

7
Negative bias temperature instability on plasma-nitrided silicon dioxide film

Ang, CH; Lek, CM; Tan, SS; Cho, Byung Jin; Chen, TP; Lin, WH; Zhen, JZ, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, v.41, no.3B, pp.314 - 316, 2002-03

8
Performance comparison of wet-etched and dry-etched Geiger-mode avalanche photodiodes using a single diffusion process

Lee, Ki Won; Yang, Kyounghoon, PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, v.10, no.11, pp.1445 - 1447, 2013-11

9
Reduction of stress-induced leakage currents in thin oxides by application of a low post-stress gate bias

Ang, CH; Ling, CH; Cheng, ZY; Cho, Byung Jin; Kim, SJ, JOURNAL OF APPLIED PHYSICS, v.88, no.5, pp.3087 - 3089, 2000-09

10
Strong interactions of single atoms and photons near a dielectric boundary

Alton, D. J.; Stern, N. P.; Aoki, Takao; Lee, Hansuek; Ostby, E.; Vahala, K. J.; Kimble, H. J., NATURE PHYSICS, v.7, no.2, pp.159 - 165, 2011-02

11
Tomographic active optical trapping of arbitrarily shaped objects by exploiting 3D refractive index maps

Kim, Kyoohyun; Park, YongKeun, NATURE COMMUNICATIONS, v.8, pp.15340, 2017-05

12
Ultralarge capacitance-voltage hysteresis and charge retention characteristics in metal oxide semiconductor structure containing nanocrystals deposited by ion-beam-assisted electron beam deposition

Kim, Y; Park, KH; Chung, TH; Bark, HJ; Yi, JY; Choi, WC; Kim, EK; et al, APPLIED PHYSICS LETTERS, v.78, no.7, pp.934 - 936, 2001-02

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