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A STUDY OF LATTICE DAMAGE IN SILICON INDUCED BY BF2+ ION-IMPLANTATION PAEK, MC; KWON, OJ; Lee, JeongYong; Lim, Ho Bin, JOURNAL OF APPLIED PHYSICS, v.70, no.8, pp.4176 - 4180, 1991-10 |
Atomic-Scale Quantification of Grain Boundary Segregation in Nanocrystalline Material Herbig, M.; Raabe, D.; Li, Y. J.; Choi, Pyuck-Pa; Zaefferer, S.; Goto, S., PHYSICAL REVIEW LETTERS, v.112, no.12, 2014-03 |
Fundamental Aspects of Energy Dissipation in Friction Park, JeongYoung; Salmeron, Miguel, CHEMICAL REVIEWS, v.114, no.1, pp.677 - 711, 2014-01 |
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