Browse by Subject ION-IMPLANTED SILICON

Showing results 1 to 2 of 2

1
Boron profile narrowing in laser-processed silicon after rapid thermal anneal

Poon, CH; Tan, LS; Cho, Byung Jinresearcher; See, A; Bhat, M, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.151, no.1, pp.80 - 83, 2004-01

2
Study of Shallow Backside Junctions for Backside Illumination of CMOS Image Sensors

Choi, Chung Seok; Yeo, Sang Chul; Kim, Dohwan; Kim, Jongchae; Yoo, Kyung Dong; Lee, Hyuck Moresearcher, JOURNAL OF ELECTRONIC MATERIALS, v.43, no.11, pp.3933 - 3941, 2014-11

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