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Showing results 1 to 5 of 5

1
Compensation of phase change on reflection in white-light interferometry for step height measurement

Park, MC; Kim, Seung-Woo, OPTICS LETTERS, v.26, no.7, pp.420 - 422, 2001-04

2
Evaluation of spectral phase in spectrally resolved white-light interferometry: Comparative study of single-frame techniques

Debnath, Sanjit K.; Kothiyal, Mahendra P.; Kim, Seung-Woo, OPTICS AND LASERS IN ENGINEERING, v.47, no.11, pp.1125 - 1130, 2009-11

3
Lateral-shearing interferometer using square prisms for optical testing of aspheric lenses

Kim, Seung-Woo; Cho, WJ; Kim, BC, MEASUREMENT SCIENCE TECHNOLOGY, v.9, no.7, pp.1129 - 1136, 1998-07

4
Spectrally resolved phase-shifting interference microscopy: technique based on optical coherence tomography for profiling a transparent film on a patterned substrate

Debnath, Sanjit K.; Kim, Seung-Woo; Kothiyal, Mahendra P.; Hariharan, Parameswaran, APPLIED OPTICS, v.49, no.34, pp.6624 - 6629, 2010-12

5
Thickness-profile measurement of transparent thin-film layers by white-light scanning interferometry

Kim, Seung-Woo; Kim, GH, APPLIED OPTICS, v.38, no.28, pp.5968 - 5973, 1999-10

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