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Bias and thermal annealings of radiation-induced leakage currents in thin-gate oxides Ang, CH; Ling, CH; Cheng, ZY; Kim, SJ; Cho, Byung Jin, IEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.47, no.6, pp.2764 - 4, 2000-12 |
Metal-dependent Fermi-level movement in the metal/sulfur-passivated InGaP contact Kim, YK; Kim, Sehun; Seo, JM; Ahn, S; Kim, KJ; Kang, TH; Kim, B, JOURNAL OF VACUUM SCIENCE TECHNOLOGY A-VACUUM SURFACES AND FILMS, v.15, no.3, pp.1124 - 1128, 1997 |
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